Environmental Scanning Electron Microscopy & Energy Dispersive X-ray Analysis

The National Centre of Tribology (NCT) uses state of the art microscopy equipment to get the bigger picture.

Our Hitachi S3500N is an Environmental Scanning Electron Microscope (ESEM) equipped with a thin window EDX system. This allows examination of conductive specimens at high magnification with high depth of field. The variable pressure mode also enables non-conducting materials to be examined, for instance contaminant particle analysis of lubricants and greases.

The semi quantitative EDX system allows elemental analysis to determine bulk composition, particle analysis and corrosion product assessment. Mapping and line functions also enable multi-phased systems and interfaces to be identified.

The Environmental Scanning Electron Microscope is ideally suited for:

  • High magnification imaging
  • Conducting and non-conducting items (metals, ceramics, polymers, lubricants)
  • Quantitative elemental analysis of materials, particles & corrosion products
Scanning Electron Microscope SEM


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